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  • Product Code: #378-184-1

    FS-70 Microscope for Semiconductor Inspections - Series 378

    Range: 1.96" /50mm

    Optical Pass Ratio: 50/50

    Price:
    Lowest Price Guaranteed

    Product Description

    378-184-1 Mitutoyo FS-70 Microscope for Semiconductor Inspection - FS70

    The Mitutoyo 378-184-1 FS-70 Microscope for Semiconductor Inspection - has the following specifications:

    • Range: 1.96"/50mm
    • Adjustment: 0.1mm/rev. for fine adjustment, 3.8mm/rev. for coarse adjustment
    • Focus Adjustment Method: 50mm travel range with concentric coarse (3.8mm/rev) and fine focusing wheels (right and left)
    • Trinocular tube Image: Erect image
    • Pupil distance: Siedentopf type,adjustment range: 2-3" / 51-76mm
    • Field number: 24
    • Tilt angle: N/A
    • Optical pass ratio: 50/50
    • Protective filter: N/A
    • Tube lens: 1X
    • Applicable laser: N/A
    • Camera mount: C-mount (using optional adapter B) 
    • Illumination system: Reflective illumination for bright field (Koehler illumination, with aperture diaphram)
    • Light source (optional): 12V100W fiber optics, non-stepped adjustment, light guide length 1.5m, power consumption 150W
    • Objectives (optional): M Plan Apo, M Plan Apo SL, G Plan Apo
    • Objective, optional (for laser-cutting): N/A
    • Loading Weight: 32lbs/14.5kg
    • Mass (main unit): 13lbs/6.1kg

    Features:

    • The optical system that was developed for the best-selling FS 60 models was further enhanced for the FS70 models. It is ideal as a microscope unit of a prober station for semiconductors. (All models CE marked.)
    • The FS70L supports three types of YAG laser wavelength ranges (1064nm, 532nm and 355nm), while the FS70L4 supports two types of wavelength ranges (532nm and 266nm), thus expanding a scope of laser applications, allowing laser-cutting of thin-films used in semiconductors and liquid crystal substrates. However, Mitutoyo assumes no responsibility for the performance and/or safety of the laser system used with Mitutoyo microscopes. Careful examination is recommended in selecting a laser-emission unit.
    • Bright field, differential interference contrast (DIC) and polarized observations are optional with FS70Z and FS70. The FS70L and FS70L4 do not support the DIC method.
    • By employing an inward revolver, the long working distance objectives provide excellent operability.
    • An ergonomic design with superb operability: the FS70 employs the erectimage optical system (the image in the field of view has the same orientation as the specimen) and enlarged fine focus adjustment wheel with rubber-grip coarse adjustment knob.

    FS-70 Microscopes for Semiconductor Inspection

    • 378-184-1 FS-70 Microscope for Semiconductor Inspection - FS70
    • 378-184-3 FS-70 Microscope for Semiconductor Inspection - FS70-TH
    • 378-185-1 FS-70 Microscope for Semiconductor Inspection - FS70Z
    • 378-185-3 FS-70 Microscope for Semiconductor Inspection - FS702-TH
    • 378-186-1 FS-70 Microscope for Semiconductor Inspection - FS70L
    • 378-186-3 FS-70 Microscope for Semiconductor Inspection - FS70L-TH
    • 378-187-1 FS-70 Microscope for Semiconductor Inspection - FS70L4
    • 378-187-3 FS-70 Microscope for Semiconductor Inspection - FS70L4-TH

    FS-70 Short Base Model Microscopes for Semiconductor Inspection

    • 378-184-2 FS-70 Short Base Model Microscope for Semiconductor Inspection - FS70-S
    • 378-184-4 FS-70 Short Base Model Microscope for Semiconductor Inspection - FS70-THS
    • 378-185-2 FS-70 Short Base Model Microscope for Semiconductor Inspection - FS70Z-S
    • 378-185-4 FS-70 Short Base Model Microscope for Semiconductor Inspection - FS70Z-THS
    • 378-186-2 FS-70 Short Base Model Microscope for Semiconductor Inspection - FS70L-S
    • 378-186-4 FS-70 Short Base Model Microscope for Semiconductor Inspection - FS70L-THS
    • 378-187-2 FS-70 Short Base Model Microscope for Semiconductor Inspection - FS70L4-S
    • 378-187-4 FS-70 Short Base Model Microscope for Semiconductor Inspection - FS70L4-THS
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