Mitutoyo FS-70 Short Base Model for Semiconductor Inspections – Series 378
Product Code: 378-184-2MFGID: 378-184-2
Brand: Mitutoyo
Product Description
378-184-2 Mitutoyo FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70-S
The Mitutoyo 378-184-2 FS-70 Short Base Model Microscope for Semiconductor Inspection – has the following specifications:
- Short Base Model
- Range: 1.96″/50mm
- Adjustment: 0.1mm/rev. for fine adjustment, 3.8mm/rev. for coarse adjustment
- Focus Adjustment Method: 50mm travel range with concentric coarse (3.8mm/rev) and fine focusing wheels (right and left)
- Trinocular tube Image: Erect image
- Pupil distance: Siedentopf type,adjustment range: 2-3″ / 51-76mm
- Field number: 24
- Tilt angle: N/A
- Optical pass ratio: 50/50
- Protective filter: N/A
- Tube lens: 1X
- Applicable laser: N/A
- Camera mount: C-mount (using optional adapter B)
- Illumination system: Reflective illumination for bright field (Koehler illumination, with aperture diaphram)
- Light source (optional): 12V100W fiber optics, non-stepped adjustment, light guide length 1.5m, power consumption 150W
- Objectives (optional): M Plan Apo, M Plan Apo SL, G Plan Apo
- Objective, optional (for laser-cutting): N/A
- Loading Weight: 32lbs/14.5kg
- Mass (main unit): 13lbs/6.1kg
Features:
- The optical system that was developed for the best-selling FS 60 models was further enhanced for the FS70 models. It is ideal as a microscope unit of a prober station for semiconductors. (All models CE marked.)
- The FS70L supports three types of YAG laser wavelength ranges (1064nm, 532nm and 355nm), while the FS70L4 supports two types of wavelength ranges (532nm and 266nm), thus expanding a scope of laser applications, allowing laser-cutting of thin-films used in semiconductors and liquid crystal substrates. However, Mitutoyo assumes no responsibility for the performance and/or safety of the laser system used with Mitutoyo microscopes. Careful examination is recommended in selecting a laser-emission unit.
- Bright field, differential interference contrast (DIC) and polarized observations are optional with FS70Z and FS70. The FS70L and FS70L4 do not support the DIC method.
- By employing an inward revolver, the long working distance objectives provide excellent operability.
- An ergonomic design with superb operability: the FS70 employs the erectimage optical system (the image in the field of view has the same orientation as the specimen) and enlarged fine focus adjustment wheel with rubber-grip coarse adjustment knob.
FS-70 Short Base Model Microscopes Units for Semiconductor Inspection
- 378-184-2 FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70-S
- 378-184-4 FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70-THS
- 378-185-2 FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70Z-S
- 378-185-4 FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70Z-THS
- 378-186-2 FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70L-S
- 378-186-4 FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70L-THS
- 378-187-2 FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70L4-S
- 378-187-4 FS-70 Short Base Model Microscope for Semiconductor Inspection – FS70L4-THS
FS-70 Microscopes Units for Semiconductor Inspection
- 378-184-1 FS-70 Microscope for Semiconductor Inspection – FS70
- 378-184-3 FS-70 Microscope for Semiconductor Inspection – FS70-TH
- 378-185-1 FS-70 Microscope for Semiconductor Inspection – FS70Z
- 378-185-3 FS-70 Microscope for Semiconductor Inspection – FS702-TH
- 378-186-1 FS-70 Microscope for Semiconductor Inspection – FS70L
- 378-186-3 FS-70 Microscope for Semiconductor Inspection – FS70L-TH
- 378-187-1 FS-70 Microscope for Semiconductor Inspection – FS70L4
- 378-187-3 FS-70 Microscope for Semiconductor Inspection – FS70L4-TH
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